Portal InstitucionalUFPEL

Objetivo Geral:

1. Propriedades Físicas e Estruturais de Nanocristais.
2. Métodos Físicos para Síntese de Nanocristais.
3. Métodos Químicos para Síntese de Nanocristais.
4. Técnicas de Caracterização estrutural e eletrônicas
5. Microscopia Eletrônica
6. Espectroscopia Raman e Ultravioleta–Visivel.
7. Difração de Raios X
8. Espectroscopias de Absorção de Raios-X.
9. Espectroscopia de Fotoluminescência e Radio-Luminescência.

Bibliografia Básica:

• Nanocrystals. Synthesis, Properties and Applications, C.N.R. Rao, F.R.S., P.J. Thomas, G.U. Kulkarni, Springer-Verlag, Berlin Heidelberg, 2007.
• Introduction to Solid States Physics, seventh edition, C. Kittel, John Wiley & Sons, Inc., New York, 1996.
• Solid State Physics, N. W. Ashcroft, N. D. Mermin, Holt, Saunders College Publishers, Fort Worth, 1976.

Bibliografia Complementar:

• Elements of x-ray diffraction, second edition, B.D. Cullity, Addison-Wesley Pub. Co., 1978 Original from the University of Michigan.
• Introduction to Solid State Theory, O. Madelung, Springer Verlag, 1981.
• Mycroscopy and Analysis, third edition, P.J. Goodhew, J. Humphreys, R. Beanland, Taylor & Francis INC, London, 2001.
• Modern Raman Spectroscopy, A Practical Approach, E. Smith, G. Dent, John Wiley & Sons Ltd, Chichester, West Sussex PO19 8SQ, England, 2005.
• INTRODUCTION TO XAFS - A Practical Guide to X-ray Absorption Fine Structure Spectroscopy, G. Bunker, Cambridge University Press, Cambridge, 2010.
• Young, R.A.(1993), The Rietveld Method, Oxford: University Press. (ISBN 0 19 8555776), Chapter 2: by Hugo Rietveld.
• A. Kitai, Luminescenct Materials and applications, John Wiley & Sons Ltd, The Atrium, Southern Gate, Chichester, West Sussex PO19 8SQ, England.